BSH compliant measuring equipment


Here you will find special measuring equipment and measuring devices that were developed in cooperation with and for B/S/H/ and are described in their internal EMC standard "BSH EMC requirements specification for modules".

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7cm 20pF coupling clamp


according “BSH EMC requirements specification for modules” chapter “2.2.2 Burst, capacitive application on other than AC mains supply wires”

Basic-test-board for test setup


according “BSH EMC requirements specification for modules” Kapitel 1.7 “basic test setup”

The basic test board is used for all module tests to enable constant and defined test setups. This increases the reproducibility of the tests and the comparability across different EMC laboratories.

EMC ground system


Allows a safe and quick high frequency and DC ground contacting to a conductive surface just by placing it on it.
12 holes for 4mm plugs

HTH (Human Touch Hand)


according BSH EMC requirement

The HTH is a device that simulates a real clenched hand with an extended index finger while operating a touch panel. Both the resistance ratios in the static and in the dynamic range were taken into account

Cooling System 10KW


The cooling system offers a cooling capacity of 10KW. It is EMC compatible and can be used for both radiation and interference measurements.

The cooling capacity can be distributed over three cooling circuits. The cooling energy can be obtained from three sources:

VCP vertical coupling plate


according “BSH EMC requirements specification for modules” Kapitel 2.1.2.1.2 “Test setup VCP”

The VCP is a vertically arranged metal plate used in ESD testing. It is set up at a defined distance from the DUT (10 cm or 5 cm) and shot at with an ESD pistol.

Device for injection current


according “BSH EMC requirements specification for modules” Kapitel 2.4.1 Conducted immunity (injected current), applied to DUT mains supply”

In this test, an HF current is injected into the main supply lines of the test object, which changes the voltage potential of the test object in the same cycle.